Spotlight: Shedding Light on Next-Generation Detection for Microscopists.
EMC is the 17th of its kind and will bring the world of scientific imaging together in one of Europe’s most beautiful cities.
Copenhagen, Denmark. 25th – 30th September 2024
MIPAR Spotlight: Shedding Light on Next-Generation Detection for Microscopists
Background
For scientists and engineers across various disciplines, image analysis is a vital tool for gaining
deeper insights into complex phenomena. Whether studying biological structures, geological
formations, engineering components, or materials microstructures, the ability to extract quantitative
data from images is invaluable. Image analysis enables engineers and researchers to replace manual
analysis and increase productivity, gain additional data insights, improve statistics, and
advance their work by solving complex problems. By harnessing the power of image analysis,
scientists and engineers can accelerate research, optimize manufacturing processes, and improve
the performance of products across a wide range of fields, ultimately advancing our understanding of the
natural world and improving technology.
Method and results
Using deep learning and powerful image analysis engines, MIPAR (www.mipar.us) allows users to
perform fast, accurate, and automated analysis of images. Through a user-friendly interface,
engineers and researchers can personalize analysis to their samples and visualize and extract
measurements – all without programming. Through five integrated applications, MIPAR offers
flexibility and efficiency for 2D and 3D analysis applications. The key ingredients are in the Recipes,
which include a series of analysis steps tailored to each application. As a result, researchers
and engineers can now easily solve problems such as grain size analysis excluding twins, particle
analysis of clusters, defect identification, and many more.
Seamlessly integrated within the MIPAR ecosystem, the Snap tool, powered by Spotlight, offers
accelerated creation of training datasets for an efficient and streamlined model training workflow.
The accurate segmentations provided by Spotlight allow for less time spent creating models and
algorithms, leading to faster data collection. MIPAR Spotlight simplifies image analysis even further
by limiting the need for custom model configurations and amplifying a model’s ability.
Conclusion
This presentation will overview the advantages of using MIPAR Spotlight, the new cutting-edge of
detection, to analyze grains, particles, droplets, and defects with real industrial applications.
